20110112實驗室日誌

testing AFM mode (contact mode)
sample: GaSb

雜訊情況:
contact 前 0Hz~ 100Hz: 400~500mV
contact 後 0Hz~ 100Hz: 1.5~2V

cable cap: Axis3: 888nf；Axis2: 951nf；Axis1: 1004nf

Parameter:
Scan Range X: 1002 nm
Scan Range Y: 1002 nm
Scan Rotation: 90 deg
Scan Speed: 80 nm/s
Regulator P: 0.003
Regulator I: 18 Hz
Regulator Setpoint: 2.7
Slope Compensation: on
Slope Compensation X: -20 %
Slope Compensation Y: -20 %