20110331實驗室日誌

Training STM mode - Mai & 文斌
* 掃出graphite之step

parameter:
Scan Offset X: 1715 nm
Scan Offset Y: 1572 nm
Scan Rotation: 90 deg
Scan Speed: 150 nm/s
Slope Compensation: on
Slope Compensation X: 0 %
Slope Compensation Y: -15 %
DAC 1: 0.1001 V
Positioning Speed X: 1000 nm/s
Positioning Speed Y: 1000 nm/s
ADC1 Ext. Transfer Fct Gain: 10
ADC1 Ext. Transfer Fct Offset: 68.46 mV
ADC1 Ext. Transfer Fct Unit: nA

20110329實驗室日誌

training STM mode - Mai

* change the new tip (0.5mm)
* making a new surface of graphite
* check the cables
* approach
* scanner
* 以鋁箔紙包覆保麗龍並將系統包覆以隔絕環境並加以屏蔽:
雜訊從4pA ~ -4pA 改善為2pA~ -2pA，低頻由400減低為300

20110328實驗室日誌

P=3.3E-4
*將insert抽真空並放入cryostat以隔絕環境，testing STM mod。
狀況: approach 並達到電流穿隧後，scanner呈現不穩定的情況。
(每當scanner上升並達到穿隧時，scanner則呈現下降些許距離並再次持續上升，此情況反覆出現，由於scanner不穩定所以無法掃描，研判可能因為環境噪音的影響。)

*將scanner退後500步，並破真空，再次執行相同步驟但是依然呈現不穩定的情況。

20110325實驗室日誌

training STM mode - Mai
*掃出標準試片graphite的step，但是周圍環境影響，所以雜訊較大

parameter :
Scan Range X: 1002 nm
Scan Range Y: 1002 nm
Scan Rotation: 0 deg
Sample Time: 2.564e+04 us
Scan Speed: 150 nm/s
Slope Compensation: on
Slope Compensation X: 7 %
Slope Compensation Y: 0 %
DAC 1: 0.3 V
Positioning Speed X: 1000 nm/s
Positioning Speed Y: 1000 nm/s

20110324實驗室日誌

training AFM mode - Mai

parameter:

Scan Range X: 3.3e+04 nm
Scan Range Y: 3.3e+04 nm
Scan Rotation: 0 deg
Scan Speed: 4000 nm/s
Slope Compensation: on
Slope Compensation X: 4 %
Slope Compensation Y: 0 %
Positioning Speed X: 5000 nm/s
Positioning Speed Y: 5000 nm/s

20110323實驗室日誌

replace the new scanner
testing the Z scanner :
* Z scanner 可承受最大偏壓為60V
new scanner 電容值:
X - 0.68 mf
Y - 0.71 mf
Z - 2.89 mf

* Training - Mai
* AFM contact mode
parameter:

Scan Range X: 3.5e+04 nm
Scan Range Y: 3.5e+04 nm
Scan Rotation: 90 deg
Scan Speed: 4083 nm/s
Feedback Loop: on
Actual Value Select: ADC1
Regulator P: 0.002
Regulator I: 2 Hz
Regulator Setpoint: 2.8
Slope Compensation: on
Slope Compensation X: 5 %
Slope Compensation Y: -3 %