20101230實驗室日誌

exchange the new Tip (0.05mm) for TF-AFM
parameter：
Scan Range X: 3.5e+04 nm
Scan Range Y: 3.5e+04 nm
Scan Offset X: 2.75e+04 nm
Scan Rotation: 90 deg
Scan Speed: 3000 nm/s
Regulator P: 0.003
Regulator I: 6 Hz
Regulator Setpoint: 0.48
Excitation Amplitude: 0.04 V
Excitation Frequency: 32.4675 kHz
DAC 1: 2 V

Result：after exchanging the new Tip, the quality of surface morphology was better.

20101229實驗室日誌

tuning fork AFM test
sample:：standard

parameter：
Scan Range X: 3.5e+04 nm
Scan Range Y: 3.5e+04 nm
Scan Rotation: 90 deg
Scan Speed: 3500 nm/s
Regulator P: 0.003
Regulator I: 6 Hz
Regulator Setpoint: 0.4
Excitation Amplitude: 0.04 V
Excitation Frequency: 32.418472 kHz
DAC 1: 2 V

Result：

20101229實驗室日誌

setup the optical cable:

20101228實驗室日誌

making Tip for STM and TF-AFM：
diameter：STM (0.5mm)
                 TF-AFM (0.05mm)

SOP for 0.05mm with Labview
1. bias 10V to cutting the tip
2. droping 0.5mm
3. bias 5V ~ 7V (1mA)
4. bias 1.1V ~ 1.5V (0.1mA)

SEM:

20101228實驗室日誌 - Group meeting

Part I：

Part II

20101220-1224 實驗室日誌

Test SPM (Tuning fork AFM)：
connect with the homemade control box, and use the short cables.
Mode：Tuning Fork AFM
Sample：standard sample

parameter：
Scan Range X: 3.5e+04 nm
Scan Range Y: 3.5e+04 nm
Scan Rotation: 90 deg
Scan Speed: 3500 nm/s
Regulator P: 0.2
Regulator I: 20 Hz
Regulator Setpoint: 0.45
DAC 1: 2 V

測試時使用有厚度的保麗龍罩住housing以隔絕外界環境之干擾，並用鋁箔將保麗龍包覆已達到屏蔽的效用，將雜訊減小。

Result：scanning on the optical table, more stably and noiseless, but the bad quality of TF-AFM tip caused the unclear surface morphology.

20101216-1217 實驗室日誌

making the controller for SPM：

1. 先將cube上各pin的連接位置預設好

 

2. 焊接時使用熱縮套管避免中心線與接地線相互接觸

3. 紅色為中心線，黑色為接地線，並將紅色標示於接頭處

4. 將cube之pin腳與接頭連接做測試

5. 可觀察到cube與控制系統連接上之電容值

6. 初步完成圖





20101210實驗室日誌

為改善Attocube SPM system因長柱型結構導致容易震動的缺點，因此將實驗housing拆下，並自行製作一個控制盒，以連接控制系統。
1. 將stick上的housing拆下
2. check cube上各個pin與系統的連結

20101206-1208 SPM Training

12/6~12/8：


SPM training：for NCTU & RCAS
Mode：STM; AFM; TF-AFM
Members：8~10
Process：
1. introductions of Attocube SPM system
2. working theory of STM; AFM; TF-AFM
3. SPM scanning head and other parts
4. connections
5. setup the SPM software
6. approach and auto approach
7. scanning and Q&A

Result：
STM：noise較大，scanning的情況較不穩定
AFM：掃圖情況較為良好，但laser剛開啟較不穩定

Tuning Fork AFM：

 

20101203實驗室日誌

Making STM and Tuning Fork AFM Tip：
For STM：

tip diameter：0.5mm
bias：5V

For TF-AFM：
Using Labview program to control V, I and I(min). power supply：keithy 2400
tip diameter：0.05mm bias：4V
minimum current：1E-4 A

1. take off the insert from cryostat, and exchanged the STM sample & Tip
2. testing STM mode