20101220-1224 實驗室日誌

Test SPM (Tuning fork AFM)：
connect with the homemade control box, and use the short cables.
Mode：Tuning Fork AFM
Sample：standard sample

parameter：
Scan Range X: 3.5e+04 nm
Scan Range Y: 3.5e+04 nm
Scan Rotation: 90 deg
Scan Speed: 3500 nm/s
Regulator P: 0.2
Regulator I: 20 Hz
Regulator Setpoint: 0.45
DAC 1: 2 V

測試時使用有厚度的保麗龍罩住housing以隔絕外界環境之干擾，並用鋁箔將保麗龍包覆已達到屏蔽的效用，將雜訊減小。

Result：scanning on the optical table, more stably and noiseless, but the bad quality of TF-AFM tip caused the unclear surface morphology.