20101230實驗室日誌

exchange the new Tip (0.05mm) for TF-AFM
parameter：
Scan Range X: 3.5e+04 nm
Scan Range Y: 3.5e+04 nm
Scan Offset X: 2.75e+04 nm
Scan Rotation: 90 deg
Scan Speed: 3000 nm/s
Regulator P: 0.003
Regulator I: 6 Hz
Regulator Setpoint: 0.48
Excitation Amplitude: 0.04 V
Excitation Frequency: 32.4675 kHz
DAC 1: 2 V

Result：after exchanging the new Tip, the quality of surface morphology was better.