20101229實驗室日誌

tuning fork AFM test
sample:：standard

parameter：
Scan Range X: 3.5e+04 nm
Scan Range Y: 3.5e+04 nm
Scan Rotation: 90 deg
Scan Speed: 3500 nm/s
Regulator P: 0.003
Regulator I: 6 Hz
Regulator Setpoint: 0.4
Excitation Amplitude: 0.04 V
Excitation Frequency: 32.418472 kHz
DAC 1: 2 V

Result：