20101123實驗室日誌

* scanning with TF-AFM (in the cryostat)
parameters：
Scan Range X: 3.5e+04 nm
Scan Range Y: 3.5e+04 nm
Scan Speed: 4004 nm/s
Regulator P: 0.3
Regulator I: 8 Hz
Excitation Amplitude: 0.04 V
Excitation Frequency: 32.684533 kHz

* change the AFM scanning head and standard sample：
Scan Range X: 3.5e+04 nm
Scan Range Y: 3.5e+04 nm
Scan Speed: 4000 nm/s
Regulator P: 0.003
Regulator I: 12 Hz
Regulator Setpoint: 2.5